IP Library › Assignment 022837/0731
Patent Assignment
Reel/Frame 022837/0731

Assignment of Assignor's Interest

Recorded: 2009-06-17 Pages: 2
Assignors
YOSHITAKE, YASUHIRO
Executed: 2009-04-17
NAKANO, HIROYUKI
Executed: 2009-04-21
SHIBATA, YUKIHIRO
Executed: 2009-04-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method and Apparatus for Inspecting Defects
Patent: 8,121,398 →
Application: 12/420,932 →
Publication: US 2009/0257647
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →