Patent Assignment
Reel/Frame 022949/0132
Assignment of Assignor's Interest
Recorded: 2009-07-14
Pages: 2
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Scanning Type Charged Particle Beam Microscope and an Image Processing Method Using the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.