Patent Assignment
Reel/Frame 023022/0854
Assignment of Assignor's Interest
Recorded: 2009-07-29
Pages: 4
Assignors
WAKIYAMA, SHIGERU
Executed: 2009-05-11
YAMAMOTO, HIROYOSHI
Executed: 2009-05-11
SHIKAKURA, YOSHITERU
Executed: 2009-05-11
KITAJIMA, ITARU
Executed: 2009-05-11
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Probe Aligning Method for Probe Microscope and Probe Microscope Operated by the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.