IP Library Assignment 023066/0120
Patent Assignment
Reel/Frame 023066/0120

Assignment of Assignor's Interest

Recorded: 2009-08-07 Pages: 9
Assignors
LIM, BARBARA FONG CHIN
Executed: 2009-07-29
LAI, KENG HENG
Executed: 2009-07-16
YANG, TANYA
Executed: 2009-07-16
LIM, VICTOR SENG KEONG
Executed: 2009-07-16
GN, FANG HONG
Executed: 2009-07-16
HSIA, LIANG CHOO
Executed: 2009-07-20
Assignee
CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
60 WOODLANDS INDUSTRIAL PARK D STREET 2, SINGAPORE, 738406, SINGAPORE
Covered Property (1)
Defect Monitoring in Semiconductor Device Fabrication
Patent: 8,339,449 →
Application: 12/537,269 →
Publication: US 2011/0032348
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jul 28, 2010
From: CHARTERED SEMICONDUCTOR MANUFACTURING LTD.
To: CHARTERED SEMICONDUCTOR MANUFACTURING PTE. LTD.
Reel/Frame 024741/0706 →
Change of Name Jul 28, 2010
From: CHARTERED SEMICONDUCTOR MANUFACTURING PTE. LTD.
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 024741/0712 →
Security Agreement Nov 27, 2018
From: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 047660/0203 →
Release of Security Interest Nov 19, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 054481/0673 →