Patent Assignment
Reel/Frame 023073/0058
Assignment of Assignor's Interest
Recorded: 2009-08-10
Pages: 2
Assignor
TAMAI, KOHICHI
Executed: 2009-07-14
Assignee
FUJITSU MICROELECTRONICS LIMITED
7-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU,, TOKYO, 163-0722, JAPAN
Covered Property
(1)
Inter-Device Connection Test Circuit Generating Method, Generation Apparatus, and Its Storage Medium
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.