Patent Assignment
Reel/Frame 023084/0160
Assignment of Assignor's Interest
Recorded: 2009-08-12
Pages: 5
Assignors
YASUDA, NAKAHIRO
Executed: 2003-12-24
BENTON, ERIC
Executed: 2003-12-24
ISHII, HITOSHI
Executed: 2003-12-24
TAKAYAMA, SUMIKO
Executed: 2003-12-24
INAGAKI, SHINSUKE
Executed: 2003-12-24
KOBAYASHI, ISAO
Executed: 2003-12-24
HIGASHIMATA, ATSUSHI
Executed: 2003-12-24
HONMA, YOSHIHIRO
Executed: 2003-12-24
UMESHIMA, YOSUKE
Executed: 2003-12-24
Assignees
NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES
4-9-1, ANAGAWA, INAGE-KU, CHIBA-SHI, CHIBA-KEN, 263-8555, JAPAN
SEIKO PRECISION INC.
1-1, AKANEHAMA 1-CHOME, NARASHINO-SHI, CHIBA-KEN, JAPAN
Covered Property
(1)
Sample Picture Data Processing Method and Sample Inspection System and Method