Patent Assignment
Reel/Frame 023084/0208
Assignment of Assignor's Interest
Recorded: 2009-08-13
Pages: 4
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Substrate Inspection Device and Substrate Inspection Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.