Assignment of Assignor's Interest

Recorded: 2009-08-26 Pages: 3

Assignors

IWASHITA, TOORU

Executed: 2009-08-21

SHIHARA, MASAHIKO

Executed: 2009-08-21

TANGODA, ATSUSHI

Executed: 2009-08-21

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Integrated Circuit Architecture for Testing Variable Delay Circuit

Patent: 8,395,406 →

Application: 12/461,853 →

Publication: US 2010/0052698

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.