Patent Assignment
Reel/Frame 025193/0165
Change of Name
Recorded: 2010-10-26
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Semiconductor Apparatus Including Photodiode Unit and Method of Inspection of the Same
Semiconductor Device and Method for Designing the Same
Reset Signal Generating Circuit
Differential Amplifier
Digital-To-Analog Converter Circuit, Data Driver, and Display Device Using the Digital-to-Analog Converter Circuit
Semiconductor device and method of manufacturing the same
Application:
12/458,335 →
Publication:
US 2010/0032740
Method of manufacturing semiconductor device
Application:
12/458,336 →
Publication:
US 2010/0009510
Method of Manufacturing Semiconductor Device, and Semiconductor Device
Video signal processing apparatus and method
Application:
12/458,338 →
Publication:
US 2010/0026902
Nonvolatile Semiconductor Memory Device
Semiconductor Integrated Circuit
Semiconductor Switch Control Device
Semiconductor Device and Control Method Thereof
Current Driving Circuit
Sample and Hold Circuit and Digital-to-Analog Converter Circuit
Regulator and Semiconductor Device
A Dram Having Deeper Source Drain Region Than That of an Logic Region
Semiconductor Integrated Circuit Having Latch Circuit Applied Changeable Capacitance and Method Thereof
Memory system and memory error cause specifying method
Application:
12/458,775 →
Publication:
US 2010/0023839
Method and Apparatus for Failure Analysis of Semiconductor Integrated Circuit Devices
Semiconductor Device
Optical Disk Reproduction Apparatus and Optical Disk Reproduction Method
Field-effect transistor having field-plate electrode
Application:
12/458,941 →
Publication:
US 2010/0025737
Display device and driver
Application:
12/458,942 →
Publication:
US 2010/0026730
Leadframe, Semiconductor Device, and Method of Manufacturing the Same
Booster circuit, display panel driver, and display device
Application:
12/458,967 →
Publication:
US 2010/0026679
Radio receiving apparatus and radio receiving method
Application:
12/461,010 →
Publication:
US 2010/0029237
Display Device and Signal Driver
Operational amplifier circuit and display panel driving apparatus
Application:
12/461,056 →
Publication:
US 2009/0289930
Memory test circuit which tests address access time of clock synchronized memory
Application:
12/461,066 →
Publication:
US 2010/0027359
Method of generating reliability verification library for electromigration
Application:
12/461,067 →
Publication:
US 2010/0037191
Gate Line Drive Circuit
Display Panel Driver and Display Device
Semiconductor Device with Suppressed Hump Characteristic
Operational amplifier circuit and display panel driving apparatus
Application:
12/461,115 →
Publication:
US 2010/0033463
Electrical Fuse and Semiconductor Device
Semiconductor Device
Semiconductor device and method of manufacturing the semiconductor device
Application:
12/461,161 →
Publication:
US 2010/0032754
Class Ab Amplifier Circuit and Display Apparatus
Clock Gating Circuit Having a Selector That Selects One of a Control Signal and a Scan Signal
Method of Manufacturing a Substrate, Substrate, Device Provided with a Substrate, and Determining Method
Lead Frame, Method of Manufacturing the Same, and Method of Manufacturing Semiconductor Device
Echo Cancelling Device, Communication Device, and Echo Cancelling Method Having the Error Signal Generating Circuit
Static Random Access Memory (Sram) and Test Method of the Sram Having Precharge Circuit to Precharge Bit Line
Dma Device Having Plural Buffers Storing Transfer Request Information and Dma Transfer Method
Semiconductor device having vertical field effect transistor and method of manufacturing the same
Application:
12/461,433 →
Publication:
US 2010/0052055
State Transition Management Device and Method
Semiconductor Storage Device
Address Detection Circuit and Address Detection Method
Communication Apparatus and Method Therefor
Relay circuit
Application:
12/461,470 →
Publication:
US 2010/0059661
Pulse Phase Difference Detecting Circuit and a/D Converter Using the Same
Overcurrent detection circuit
Semiconductor Device Including Power Supply Pad and Trunk Wiring Which Are Arranged at the Same Layer Level
Boost DC-DC converter control circuit and boost DC-DC converter having protection circuit interrupting overcurrent
Application:
12/461,512 →
Publication:
US 2010/0046124
Wire bonding device and wire bonding process using same
Application:
12/461,552 →
Publication:
US 2010/0051670
Power Supply Controller Having Analog to Digital Converter
Method of manufacturing semiconductor device
Application:
12/461,692 →
Publication:
US 2010/0055844
Optical Transmission Apparatus to Which Optical Cable Is Connected
Pulse Signal Generator, and Method of Generating Pulse Signal
Apparatus and method for processing image data
Application:
12/461,809 →
Publication:
US 2010/0053184
Distributed Shared Memory Multiprocessor and Data Processing Method
Display device and method for data transmission to display panel driver
Application:
12/461,827 →
Publication:
US 2010/0053123
Integrated Circuit Architecture for Testing Variable Delay Circuit
Phase-Locked Loop Circuit
Method and Apparatus for Analyzing Circuit
Application:
12/464,120 →
Publication:
US 2009/0288052
Semiconductor Wafer and Manufacturing Process for Semiconductor Device
Source Follower with Active Inductance as a Load
Substrate Processing Method and Substrate Processing Apparatus
Semiconductor Chip and Method for Manufacturing the Same and Semiconductor Device
Application:
12/466,994 →
Publication:
US 2009/0224387
Semiconductor Device and Method of Manufacturing the Same
Antenna Diversity Receiver and Antenna Switching Control Method Therefor
Application:
12/467,787 →
Publication:
US 2009/0286498
Solid-State Imager and Method of Manufacturing the Same
Application:
12/470,078 →
Publication:
US 2009/0290051
Frequency Synthesizer and Method for Controlling Same
Semiconductor Device and a Method for Manufacturing the Semiconductor Device
Application:
12/470,703 →
Publication:
US 2009/0289352
Apparatus for Manufacturing Semiconductor Device and Method for Manufacturing Semiconductor Device
Application:
12/472,118 →
Publication:
US 2009/0263976
Lead Frame and Semiconductor Device Utilizing the Same
Application:
12/473,311 →
Publication:
US 2009/0294939
Method of Manufacturing Semiconductor Device
Application:
12/474,476 →
Publication:
US 2009/0297986
Semiconductor Device Having Wiring Layer with a Wide Wiring and Fine Wirings
Semiconductor Device and Method of Manufacturing the Same
Output Drive Circuit
Lead Frame, Semiconductor Device, Method for Manufacturing Lead Frame and Method for Manufacturing Semiconductor Device
Application:
12/478,074 →
Publication:
US 2009/0309201
Semiconductor Device and Method for Manufacturing the Same
Method and Apparatus for Analysis and Design of a Semiconductor Device Using Impurity Concentration Distribution
Successive Approximation Type Analog/Digital Converter and Operation Method of Successive Approximation Type Analog/Digital Converter
Information Processing Device and Method of Controlling Instruction Fetch
Semiconductor Device
Method of Verifying Layout of Semiconductor Integrated Circuit Device
Application:
12/484,431 →
Publication:
US 2009/0319971
Method of Manufacturing Semiconductor Device
Application:
12/484,460 →
Publication:
US 2009/0311840
A Photodetector Amplifier Circuit for Controlling an on State or an Off State of an Output Transistor
Transmission Circuit
Optical Disk Device and Optical Receiver Ic
Related Assignments
(18)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 8, 2009
From: KAWAKITA, KENICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022993/0440 →
Assignment of Assignor's Interest
Jul 8, 2009
From: TSUTSUI, GEN
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022961/0325 →
Assignment of Assignor's Interest
Jul 8, 2009
From: YAMASHITA, KENJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022961/0329 →
Assignment of Assignor's Interest
Jul 8, 2009
From: NAKAGAWA, KENICHIRO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022961/0333 →
Assignment of Assignor's Interest
Jul 8, 2009
From: HASHIMOTO, TAKASUKE
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022961/0341 →
Assignment of Assignor's Interest
Jul 8, 2009
From: ASAYAMA, SHINOBU; KOMURO, TOSHIO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022970/0307 →
Assignment of Assignor's Interest
Jul 8, 2009
From: MATSUMAE, TOMOHIKO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022970/0695 →
Assignment of Assignor's Interest
Jul 8, 2009
From: KITAJIMA, HIROYASU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022970/0738 →
Assignment of Assignor's Interest
Jul 8, 2009
From: SHIMATANI, ATSUSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022961/0315 →
Assignment of Assignor's Interest
Jul 13, 2009
From: SHIMOGAWA, KENJYU; FURUTA, HIROSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022993/0341 →
Assignment of Assignor's Interest
Jul 13, 2009
From: FUKAMI, IKUO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022991/0634 →
Assignment of Assignor's Interest
Jul 14, 2009
From: NAGATA, SHUNYA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 022991/0637 →
Assignment of Assignor's Interest
Jul 16, 2009
From: SAEKI, YUTAKA
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023011/0372 →
Assignment of Assignor's Interest
Jul 16, 2009
From: TSUCHI, HIROSHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023011/0424 →
Assignment of Assignor's Interest
Jul 17, 2009
From: MIKI, ATSUNORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023022/0509 →
Assignment of Assignor's Interest
Jul 17, 2009
From: SHIRAI, HIROKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023025/0353 →
Assignment of Assignor's Interest
Jul 21, 2009
From: MONDEN, JUNJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023021/0564 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →