IP Library Assignment 023186/0345
Patent Assignment
Reel/Frame 023186/0345

Assignment of Assignor's Interest

Recorded: 2009-09-02 Pages: 3
Assignor
KUAN, CHIYAN
Executed: 2009-08-31
Assignee
HERMES MICROVISION, INC.
5F, NO. 18, CREATION ROAD 1, SCIENCE PARK, HSIN-CHU, 300, TAIWAN
Covered Property (1)
Substrate and Die Defect Inspection Method
Patent: 8,295,580 →
Application: 12/553,072 →
Publication: US 2011/0052040
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION, INC.
To: HERMES MICROVISION INCORPORATED B.V.
Reel/Frame 054866/0742 →
Assignment of Assignor's Interest Dec 29, 2020
From: HERMES MICROVISION INCORPORATED B.V.
To: ASML NETHERLANDS B.V.
Reel/Frame 054870/0156 →