Assignment of Assignor's Interest

Recorded: 2009-09-03 Pages: 3

Assignor

SUMI, YOSHIKAZU

Executed: 2009-08-21

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Test Circuit and Test Method

Application: 12/585,116 →

Publication: US 2010/0060323

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.