Assignment of Assignor's Interest

Recorded: 2009-09-13 Pages: 3

Assignor

HIRABAYASHI, KEISUKE

Executed: 2009-09-07

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Method, device, and program for predicting a manufacturing defect part of a semiconductor device

Application: 12/585,444 →

Publication: US 2010/0131915

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.