Patent Assignment
Reel/Frame 025193/0147
Change of Name
Recorded: 2010-10-26
Pages: 9
Assignor
NEC ELECTRONICS CORPORATION
Executed: 2010-04-01
Assignee
RENESAS ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU,, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN
Covered Properties
(92)
Method, device, and program for predicting a manufacturing defect part of a semiconductor device
Application:
12/585,444 →
Publication:
US 2010/0131915
Semiconductor Device
Semiconductor package having electrostatic protection circuit for semiconductor package including multiple semiconductor chips
Application:
12/585,446 →
Publication:
US 2010/0103573
Data processing apparatus, memory controlling circuit, and memory controlling method
Application:
12/585,493 →
Publication:
US 2010/0083073
Semiconductor Memory Apparatus
Semiconductor Device and Method of Supplying Internal Power to Semiconductor Device
Method of Achieving Convergence of Hold Time Error, Device and Program Therefor
Voltage Detecting Circuit
Insulated gate bipolar transistor
Application:
12/585,632 →
Publication:
US 2010/0084684
Debugging system, debugging method, debugging control method, and debugging control program
Application:
12/585,693 →
Publication:
US 2010/0122072
Multi-Thread Processor Selecting Threads on Different Schedule Pattern for Interrupt Processing and Normal Operation
Multi-Thread Processor and the Multi-Thread Processor's Interrupt Processing Method Having Interrupt Processing That Is Processed by an Associated Hardware Thread
Oscillation Circuit and Method of Controlling Same
Nonvolatile semiconductor memory device and method of manufacturing nonvolatile semiconductor memory device
Application:
12/585,826 →
Publication:
US 2010/0078706
Circuit simulation based on gate spacing from adjacent MOS transistors
Scheduling threads instructions in variably selected or predetermined order periods of requested time ratio
Multi-Thread Processor and Its Hardware Thread Scheduling Method
Semiconductor Device Including a Field Effect Transistor and Method for Manufacturing the Same
Optical Disc Apparatus
Tilt Inspection Apparatus and Method of Inspecting Tilt
Semiconductor Device
Cutting machine and method of measuring clearance
Application:
12/588,040 →
Publication:
US 2010/0018374
Charge coupled device image sensor including first amplifier connected to two registers and second amplifier connected to register
Application:
12/588,073 →
Publication:
US 2010/0085461
Charge Pump-Type Voltage Booster Circuit and Semiconductor Integrated Circuit Device
Method of manufacturing semiconductor device, semiconductor inspection apparatus, and program
Application:
12/588,151 →
Publication:
US 2010/0333052
Semiconductor device having built-in self-test circuit and method of testing the same
Application:
12/588,152 →
Publication:
US 2010/0107026
Semiconductor Device
Data processing apparatus
Application:
12/588,218 →
Publication:
US 2010/0100779
Semiconductor Device with Electric Fuse Having Interconnects and Via
Semiconductor Device Having Plural Clock Domains Which Receive Scan Clock in Common
Designing Apparatus, Designing Method, and Designing Program for Semiconductor Integrated Circuit
Regulator circuit having N-type MOS transistor controlled by error amplifier
Application:
12/588,362 →
Publication:
US 2010/0117611
Power Semiconductor Device Including Gate Lead-Out Electrode
A Semiconductor Device with Varying Bump Density Regions and Method of Manufacturing the Same
Tcp-Type Semiconductor Device and Method of Testing Thereof
Semiconductor Device and Protection Circuit
Delay device for shifting phase of strobe signal
Application:
12/588,492 →
Publication:
US 2010/0118626
Method for manufacturing a semiconductor device having a heat spreader
Application:
12/588,542 →
Publication:
US 2010/0105170
Semiconductor device and method of manufacturing the same
Application:
12/588,577 →
Publication:
US 2010/0123173
Immersion exposure device cleaning method, dummy wafer, and immersion exposure device
Application:
12/588,618 →
Publication:
US 2010/0103392
Liquid crystal display device and method of driving liquid crystal display device having a data line driver circuit
Application:
12/588,620 →
Publication:
US 2010/0110114
Semiconductor Device and Method of Manufacturing the Same
Electronic Device and Lid
Level Shift Circuit
Display Device, Controller Driver and Driving Method for Display Panel
Memory Interface and Operating Method of Memory Interface
Switching circuit
Application:
12/588,885 →
Publication:
US 2010/0120481
Video signal processing device and video signal processing method
Application:
12/588,908 →
Publication:
US 2010/0123825
Delay Adjustment Device, Semiconductor Device and Delay Adjustment Method
Semiconductor Device Including First and Second Sidewalls and Method of Manufacturing Semiconductor Device
Circuit Design Device for Conducting Failure Analysis Facilitating Design
Semiconductor Integrated Circuit Device Having Plural Delay Paths and Controller Capable of Blocking Signal Transmission in Delay Path
Wiring Layout Method of Integrated Circuit and Computer-Readable Medium Storing a Program Executed by a Computer to Execute the Same
Semiconductor Device and Method of Testing the Same
Semiconductor Device, and Programming Method and Programming System Therefor
Semiconductor device and method of manufacturing the same
Application:
12/591,040 →
Publication:
US 2010/0123200
Semiconductor device and manufacturing method therefor
Application:
12/591,041 →
Publication:
US 2010/0117244
Method of preventing sliding in manufacturing semiconductur device
Application:
12/591,049 →
Publication:
US 2010/0055855
Semiconductor Device
Semiconductor Device
Semiconductor Device and Method of Manufacturing the Same
Dicing machine and adapter for dicing machine
Application:
12/591,294 →
Publication:
US 2010/0122617
Manufacturing Method of Semiconductor Device, and Semiconductor Device
Application:
12/591,364 →
Publication:
US 2010/0140796
Method of manufacturing nonvolatile semiconductor memory device
Application:
12/591,365 →
Publication:
US 2010/0124819
Antireflection film, antireflection film manufacturing method, and semiconductor device using the antireflection film
Application:
12/591,401 →
Publication:
US 2010/0127260
Semiconductor Device and Connection Checking Method for Semiconductor Device
Semiconductor Device Including Over Voltage Protection Circuit Having Gate Discharge Circuit Operated Based on Temperature and Voltage as to Output Transistor
Layout Design Method of Semiconductor Integrated Circuit Cell to Adjust Distances Inside Cell Between Diffusion Layers and Borders of Cell
Semiconductor device including MOSFET with controlled threshold voltage, and manufacturing method of the same
Application:
12/591,545 →
Publication:
US 2010/0133622
Socket for semiconductor integrated circuit
Application:
12/591,595 →
Publication:
US 2010/0072609
Method of manufacturing semiconductor device, Exposure device, and recording medium
Application:
12/591,597 →
Publication:
US 2010/0136799
Filter coefficient calculation method and filter coefficient calculation unit
Application:
12/591,642 →
Publication:
US 2010/0138466
Oscillator Having Feedback Path Which Is Capable of Supplying Reduced Voltage Potential to Oscillation Circuit
Delay Circuit
Semiconductor Device
Semiconductor device and method of manufacturing the same
Application:
12/591,728 →
Publication:
US 2010/0133652
Semiconductor package, method of manufacturing semiconductor package, electronic component, and method of manufacturing electronic component
Application:
12/591,729 →
Publication:
US 2010/0133349
Laser diode and method of manufacturing the same
MIM capacitor and method of manufacturing the same
Application:
12/591,783 →
Publication:
US 2010/0084739
Pll Circuit and Method of Cotrolling the Same
Nonvolatile Semiconductor Memory and Method for Testing the Same
Circuit Verification Method for Verifying Circuit with Timing Information and Logic Information in Library Cell
Processor, multiprocessor, and debugging method
Application:
12/591,881 →
Publication:
US 2010/0153786
Semiconductor Device with Shield Line Disposed Between Capacitors
Semiconductor Device Having Vertical Type Mosfet and Manufacturing Method Thereof
Semiconductor integrated circuit including logic circuit having scan path and test circuit for conducting scan path test
Application:
12/591,885 →
Publication:
US 2010/0146349
Light Receiving Circuit
Semiconductor integrated circuit including transmitter and receiver which conducts loopback test and test method thereof
Application:
12/591,931 →
Publication:
US 2010/0150255
Method of Manufacturing Semiconductor Device, and Semiconductor Device
Differential Amplifier
Method of Manufacturing Semiconductor Device
Seminconductor Device
Related Assignments
(20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Sep 13, 2009
From: HIRABAYASHI, KEISUKE
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023285/0248 →
Assignment of Assignor's Interest
Sep 15, 2009
From: TANAKA, KOUJI
To: NEC ELECTRONICS CORPORATON
Reel/Frame 023285/0256 →
Assignment of Assignor's Interest
Sep 15, 2009
From: SASAKI, KOU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023285/0245 →
Assignment of Assignor's Interest
Sep 16, 2009
From: TAKEDA, KOICHI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023302/0450 →
Assignment of Assignor's Interest
Sep 16, 2009
From: TERAUCHI, YOUJI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023302/0115 →
Assignment of Assignor's Interest
Sep 16, 2009
From: JINBO, TOSHIKATSU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023302/0433 →
Assignment of Assignor's Interest
Sep 21, 2009
From: IRIE, KAZUYUKI
To: NEC ELECTRNONICS CORPORATION
Reel/Frame 023305/0127 →
Assignment of Assignor's Interest
Sep 21, 2009
From: ITO, MASAYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023318/0073 →
Assignment of Assignor's Interest
Sep 21, 2009
From: MIYAMOTO, MANABU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023318/0362 →
Assignment of Assignor's Interest
Sep 22, 2009
From: YARIMIZU, HIROKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023318/0322 →
Assignment of Assignor's Interest
Sep 23, 2009
From: ADACHI, KOJI; MATSUNAGA, TOSHIYUKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023325/0881 →
Assignment of Assignor's Interest
Sep 25, 2009
From: MATSUDA, TOMOKO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023343/0310 →
Assignment of Assignor's Interest
Sep 25, 2009
From: ADACHI, KOJI; MIYAMOTO, KAZUNORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023335/0727 →
Assignment of Assignor's Interest
Sep 25, 2009
From: IGARASHI, HATSUHIDE
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023335/0754 →
Assignment of Assignor's Interest
Sep 28, 2009
From: ADACHI, KOJI; OOMOTO, TEPPEI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023335/0717 →
Assignment of Assignor's Interest
Sep 28, 2009
From: ADACHI, KOJI; MIYAMOTO, KAZUNORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023341/0681 →
Assignment of Assignor's Interest
Sep 29, 2009
From: FUJI, HIROKI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023341/0599 →
Assignment of Assignor's Interest
Sep 30, 2009
From: OGURA, MASANORI
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023343/0283 →
Assignment of Assignor's Interest
Nov 4, 2009
From: SAKAMOTO, HIDEO
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023469/0820 →
Change of Address
Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →