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App. No. 12/588,151 · Confirmation No. 2606

Method of manufacturing semiconductor device, semiconductor inspection apparatus, and program

Inventor: Hideaki Tsuchiya
Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2012-05-07 ABN Abandonment 2 View
2011-09-06 CTNF Non-Final Rejection 2 View
2011-09-06 CTNF Non-Final Rejection 8 View
2011-09-06 892 List of references cited by examiner 1 View
2011-09-06 BIB Bibliographic Data Sheet 1 View
2011-09-06 SRNT Examiner's search strategy and results 3 View
2011-09-06 FWCLM Index of Claims 1 View
2011-09-06 1449 List of References cited by applicant and considered by examiner 1 View
2011-09-06 SRFW Search information including classification, databases and other search related notes 1 View
2011-08-29 SRNT Examiner's search strategy and results 1 View
2010-12-30 NTC.PUB Notice of Publication 1 View
2009-11-11 PD.FILED.E Priority Documents electronically retrieved by USPTO from a participating IP Office 25 View
2009-10-26 APP.FILE.REC Filing Receipt 3 View
2009-10-06 TRNA Transmittal of New Application 8 View
2009-10-06 SPEC Specification 25 View
2009-10-06 CLM Claims 9 View
2009-10-06 ABST Abstract 1 View
2009-10-06 DRW Drawings-only black and white line drawings 7 View
2009-10-06 OATH Oath or Declaration filed 2 View
2009-10-06 TRAN.LET Transmittal Letter 1 View
2009-10-06 136A Authorization for Extension of Time all replies 8 View
2009-10-06 IDS Information Disclosure Statement (IDS) Form (SB08) 1 View
2009-10-06 FOR Foreign Reference 18 View
2009-10-06 FOR Foreign Reference 38 View
2009-10-06 WFEE Fee Worksheet (SB06) 1 View
2009-10-06 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
12/588,151
Filed
2009-10-06
Pub. No.
US20100333052A1
Art Unit
2825