Assignment of Assignor's Interest

Recorded: 2009-10-06 Pages: 3

Assignor

TSUCHIYA, HIDEAKI

Executed: 2009-09-29

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Method of manufacturing semiconductor device, semiconductor inspection apparatus, and program

Application: 12/588,151 →

Publication: US 2010/0333052

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.