Semiconductor device and method of manufacturing the same

1 . A semiconductor device comprising:

a substrate;

a MIM capacitor that includes an insulating film formed over said substrate and a first electrode and a second electrode which are formed in the same layer in said insulating film and are facing to each other with said insulating film interposed therebetween, said first electrode and said second electrode respectively including a first high aspect via and a second high aspect via which extend as long as a length, in a stacked direction of said substrate, of a via and an interconnect provided on said via so as to be connected to said via formed in another region;

a first potential supply interconnect that is formed in said insulating film so as to be electrically connected to said first electrode and supplies a first potential to said first electrode; and

a second potential supply interconnect that is formed in said insulating film so as to be electrically connected to said second electrode and supplies a second potential to said second electrode.

2 . The semiconductor device as set forth in claim 1 , wherein said first potential supply interconnect is provided at the same level as a part of an upper portion of a region in which said first high aspect via extend in said stacked direction of said substrate and is connected to said first high aspect via.

3 . The semiconductor device as set forth in claim 2 , wherein said second potential supply interconnect is provided at the same level as that of said first potential supply interconnect in said stacked direction of said substrate and is connected to said second high aspect via.

4 . The semiconductor device as set forth in claim 1 ,

wherein said MIM capacitor further includes:

a first electrode interconnect that is provided below said first high aspect via so as to come into contact with said first high aspect via, and extends in a first direction; and

a second electrode interconnect that is provided below said second high aspect via so as to come into contact with said second high aspect via, and extends in said first direction.

5 . The semiconductor device as set forth in claim 1 , wherein said first high aspect via and said second high aspect via are slit vias that extend in a first direction.

6 . The semiconductor device as set forth in claim 4 ,

wherein said first electrode is formed with a plurality of said first high aspect vias, said plurality of first high aspect vias being arranged over said first electrode interconnect in said first direction, and

said second electrode is formed with a plurality of said second high aspect vias, said plurality of second high aspect vias being arranged over said second electrode interconnect in said first direction.

7 . The semiconductor device as set forth in claim 1 ,

wherein said MIM capacitor includes a plurality of said first electrodes and a plurality of said second electrodes, respectively formed in the same layer and extending in a first direction, said plurality of first electrodes and said plurality of second electrodes are alternately arranged in a second direction orthogonal to said first direction,

said first potential supply interconnect is formed at the ends of said first electrodes so as to extend in said second direction so that said first potential supply interconnect and said plurality of first electrodes have a comb shape having said plurality of first electrodes as comb teeth when seen in a plan view, and

said second potential supply interconnect is formed at the ends of said second electrodes so as to extend in said second direction so that said second potential supply interconnect and said plurality of second electrodes have a comb shape having said plurality of second electrodes as comb teeth in a plan view.

8 . The semiconductor device as set forth in claim 1 ,

wherein said first electrode includes a plurality of said first high aspect vias that is formed in a plurality of layers so as to be stacked to each other, and

said second electrode includes a plurality of said second high aspect vias that is formed in said plurality of layers so as to be stacked to each other.

9 . The semiconductor device as set forth in claim 1 , wherein said via and said interconnect provided on said via so as to be connected to said via formed in said another region have a dual damascene interconnect structure.

10 . A method of manufacturing a semiconductor device, comprising:

forming a dual damascene interconnect trench using a via-first dual damascene process which includes forming a via hole in an insulating film and forming interconnect trench that communicate with said via hole in said insulating film; and

filling said dual damascene interconnect trench with a conductive material to form a dual damascene interconnect after said forming the dual damascene interconnect trench,

wherein in said forming the via hole in said forming the dual damascene interconnect trench, a first via hole and a second via hole are formed,

in said forming the interconnect trench in said forming the dual damascene interconnect trench, said interconnect trench is formed with at least a part of said first via hole and at least a part of said second via hole being covered with a resist layer, and

in said forming the dual damascene interconnect, said first via hole and said second via hole are-filled with said conductive material to form a MIM capacitor including a first electrode formed by filling said at least a part of said first via hole with said conductive material, a second electrode formed by filling said at least a part of said second via hole with said conductive material, and said insulating film.