IP Library Patent Application 12588040
Patent Application
App. No. 12/588,040

Cutting machine and method of measuring clearance

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Quick Facts
Patent No.
US None
App. No.
12/588,040
Abstract

A cutting machine including a die, and a cutting punch having a cutting edge, and configured to bring the cutting punch close to the die to have the cutting edge face to a surface of the die thereby cut a work, the cutting punch being provided with a local slope, wherein the cutting machine is configured, using a light source, to irradiate a light such that the light transmit through the clearance between the cutting punch and the surface of the die and to reflect on the local slope such that the direction of the path of the light is changed so as to yield reflected light to be observed is provided.

Claims (11)

1 . A cutting machine comprising a die, and a cutting punch having a cutting edge, and configured to bring said cutting punch close to said die to have said cutting edge face to a surface of said die thereby cut a work, said cutting punch being provided with a local slope,

wherein said cutting machine is configured, using a light source, to irradiate a light such that the light transmit through the clearance between said cutting punch and said surface of said die and to reflect on said local slope such that the direction of the path of said light is changed so as to yield reflected light to be observed.

2 . The cutting machine as claimed in claim 1 ,

wherein said local slope of said cutting punch is inclined at a predetermined angle so as to expand the cross section of said cutting punch in the direction departing from the light source.

3 . The cutting machine as claimed in claim 2 , wherein said predetermined angle is 45°.

4 . The cutting machine as claimed in claim 1 ,

wherein said cutting punch has a plurality of said local slopes provided thereto so as to form steps.

5 . A method of measuring a clearance using the cutting machine described in claim 1 ,

configured to measure light reflected on said local slope to thereby measure said clearance.

6 . The method of measuring a clearance as claimed in claim 5 ,

configured to measure the beam width of light reflected on said local slope to thereby measure said clearance.

Assignments (2)
CHANGE OF NAME Recorded Oct 26, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025193/0147 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 1, 2009
From: KUMAMOTO, TOORU
To: NEC ELECTRONICS CORPORATION
Reel/Frame 023363/0966 →