Tilt inspection apparatus and method of inspecting tilt
View Patent ↗A tilt inspection apparatus which detects tilt of an object to be observed with respect to a placement surface on which the object is placed, including: a light source which irradiates light or projects an image onto the object to be observed; a light shield plate which has a first slit extended in a first direction and a second slit extended in a second direction normal to the first direction, and is disposed between the light source and the object to be observed; and a carriage mechanism which supports the light shield plate so as to be rotatable in the in-plane direction of the light shield plate, and fixes the light shield plate while aligning the first slit normal to the placement surface is provided.
1. A tilt inspection apparatus which detects tilt of an object to be observed with respect to a placement surface on which said object is placed, comprising:
a light source which irradiates light or projects an image onto said object to be observed;
a light shield plate which has a first slit extended in a first direction and a second slit extended in a second direction normal to said first direction, and is disposed between said light source and said object to be observed; and
a carriage mechanism which supports said light shield plate so as to be rotatable in the in-plane direction of said light shield plate, and fixes said light shield plate while aligning said first slit normal to said placement surface.
2. The tilt inspection apparatus as claimed in claim 1 ,
wherein said carriage mechanism supports said light shield plate so as to be movable in the direction of leaving away from said placement surface and in the direction of coming closer to said placement surface.
3. The tilt inspection apparatus as claimed in claim 1 ,
wherein said carriage mechanism supports said light shield plate so as to be movable in the lateral direction over said placement surface.
4. The tilt inspection apparatus as claimed in claim 2 ,
wherein said carriage mechanism supports said light shield plate so as to be movable in the lateral direction over said placement surface.
5. The tilt inspection apparatus as claimed in claim 1 ,
wherein said carriage mechanism supports said light source so as to be changeable in the angle of irradiation of light or angle of projection of image relative to said object to be observed.
6. The tilt inspection apparatus as claimed in claim 1 ,
wherein said carriage mechanism supports said light source so as to be movable while being linked with said light shield plate.
7. The tilt inspection apparatus as claimed in claim 1 ,
wherein said first slit and said second slit are provided to form a cross pattern.
8. A method of inspecting tilt of an object to be observed, using the tilt inspection apparatus described in claim 1 , by comparing a slit beam emitted from said light source and transmitted through said first slit or said second slit, or an projected blight pattern corresponded to said first slit or said second slit, with an edge of a predetermined surface composing said object to be observed.
9. The method of inspecting tilt as claimed in claim 8 ,
wherein the tilt of said object to be observed is detected by observing parallelism between said slit beam and said edge.
10. The method of inspecting tilt as claimed in claim 8 ,
wherein the tilt of said object to be observed is detected by irradiating said slit beam on said edge of said predetermined surface, and by observing parallelism of said irradiated slit beam with respect to said edge.
11. The method of inspecting tilt as claimed in claim 8 ,
wherein the tilt of said object to be observed is detected by projecting an image of said light shield plate on said edge of said predetermined surface, and by observing parallelism of said projected blight pattern with respect to said edge.
12. A method of inspecting tilt of an object to be observed with respect to a placement surface on which said object is placed, by disposing a light shield plate, which has a first slit extended in a first direction normal to said placement surface and a second slit extended in a second direction normal to said first direction, between said object to be observed and a light source; and by comparing a slit beam transmitted through said first slit or said second slit, or an projected blight pattern corresponded to said first slit or said second slit, with an edge of a predetermined surface composing said object to be observed.
13. The method of inspecting tilt as claimed in claim 12 ,
wherein the tilt of said object to be observed is detected by observing parallelism between said slit beam and said edge.
14. The method of inspecting tilt as claimed in claim 12 ,
wherein the tilt of said object to be observed is detected by irradiating said slit beam on said edge of said predetermined surface, and by observing parallelism of said irradiated slit beam with respect to said edge.
15. The method of inspecting tilt as claimed in claim 12 ,
wherein the tilt of said object to be observed is detected by projecting an image of said light shield plate on said edge of said predetermined surface, and by observing parallelism of said projected blight pattern with respect to said edge.