Semiconductor device and method of supplying internal power to semiconductor device

1. A semiconductor device comprising:

a step-down circuit group including a plurality of step-down circuits that step down an external power supply voltage to a predetermined voltage;

a plurality of functional circuits that require a reset operation upon power-on; and

a power-on reset circuit that outputs a reset command to the plurality of functional circuits, when an internal power supply voltage supplied from the step-down circuit group exceeds a voltage level necessary for an initialization operation, wherein

the plurality of step-down circuits of the step-down circuit group are classified into a startup operating step-down circuit group that performs a step-down operation from power-on to supply the internal power supply voltage, and a startup non-operating step-down circuit group that stops operation upon power-on to interrupt supply of the internal power supply voltage, and

the startup non-operating step-down circuit group includes the plurality of step-down circuits sequentially selected from one having a shortest wiring distance from the power-on reset circuit.

2. The semiconductor device according to claim 1 , wherein the step-down circuits included in the startup non-operating step-down circuit group maintain an operation stopped state before receiving the reset command from the power-on reset circuit, and start the step-down operation upon receiving the reset command.

3. A semiconductor device comprising:

a step-down circuit group including a plurality of step-down circuits that step down an external power supply voltage to a predetermined voltage;

a plurality of functional circuits that require a reset operation upon power-on; and

a power-on reset circuit that outputs a reset command to the plurality of functional circuits, when an internal power supply voltage supplied from the step-down circuit group exceeds a voltage level necessary for an initialization operation, wherein

the plurality of step-down circuits of the step-down circuit group are classified into a startup operating step-down circuit group that performs a step-down operation from power-on to supply the internal power supply voltage, and a startup non-operating step-down circuit group that stops operation upon power-on to interrupt supply of the internal power supply voltage, and

the power-on reset circuit has a longest wiring distance from the step-down circuits included in the startup operating step-down circuit group, compared to the plurality of functional circuits.

4. The semiconductor device according to claim 3 , wherein the step-down circuits included in the startup non-operating step-down circuit group maintain an operation stopped state before receiving the reset command from the power-on reset circuit, and start the step-down operation upon receiving the reset command.

5. A semiconductor device comprising:

a step-down circuit group including a plurality of step-down circuits that step down an external power supply voltage to a predetermined voltage;

a plurality of functional circuits that require a reset operation upon power-on; and

a power-on reset circuit that outputs a reset command to the plurality of functional circuits, when an internal power supply voltage supplied from the step-down circuit group exceeds a voltage level necessary for an initialization operation, wherein

the plurality of step-down circuits of the step-down circuit group are classified into a startup operating step-down circuit group that performs a step-down operation from power-on to supply the internal power supply voltage, and a startup non-operating step-down circuit group that stops operation upon power-on to interrupt supply of the internal power supply voltage,

the startup non-operating step-down circuit group includes the plurality of step-down circuits sequentially selected from one having a shortest wiring distance from the power-on reset circuit, and

the power-on reset circuit has a longest wiring distance from the step-down circuits included in the startup operating step-down circuit group, compared to the plurality of functional circuits.

6. The semiconductor device according to claim 5 , wherein the step-down circuits included in the startup non-operating step-down circuit group maintain an operation stopped state before receiving the reset command from the power-on reset circuit, and start the step-down operation upon receiving the reset command.

7. A method of supplying internal power to a semiconductor device, the semiconductor device comprising: a step-down circuit group including a plurality of step-down circuits that step down an external power supply voltage to a predetermined voltage; a plurality of functional circuits that require a reset operation upon power-on; and a power-on reset circuit that outputs a reset command to the plurality of functional circuits, when an internal power supply voltage supplied from the step-down circuit group exceeds a voltage level necessary for an initialization operation, the method comprising:

causing the plurality of step-down circuits sequentially selected from one having a shortest wiring distance from the power-on reset circuit, to stop supplying the internal power supply voltage during a period from power-on to output of the reset command.