Assignment of Assignor's Interest

Recorded: 2009-10-06 Pages: 3

Assignor

NAKAMURA, YOSHIHIRO

Executed: 2009-09-29

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Semiconductor device having built-in self-test circuit and method of testing the same

Application: 12/588,152 →

Publication: US 2010/0107026

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.