Patent Assignment
Reel/Frame 023516/0298
Assignment of Assignor's Interest
Recorded: 2009-11-13
Pages: 4
Assignor
WATANABE, DAISUKE
Executed: 2009-10-27
Assignee
ADVANTEST CORPORATION
1-32-1, ASAHI-CHO, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property
(1)
Semiconductor Test Apparatus and Test Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.