Patent Assignment
Reel/Frame 023632/0891
Assignment of Assignor's Interest
Recorded: 2009-12-03
Pages: 3
Assignor
ASOU, MASAO
Executed: 2009-11-19
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor integrated circuit including logic circuit having scan path and test circuit for conducting scan path test
Application:
12/591,885 →
Publication:
US 2010/0146349
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.