Assignment of Assignor's Interest

Recorded: 2009-12-15 Pages: 3

Assignors

YOSHIOKA, MUTSUHIKO

Executed: 2007-04-18

FUJIYAMA, HITOSHI

Executed: 2007-04-18

IGARASHI, HISAO

Executed: 2007-04-18

Assignee

JSR CORPORATION

6-10, TSUKIJI 5-CHOME, CHUO-KU, TOKYO, 104-0045, JAPAN

Covered Property (1)

Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection Apparatus

Patent: 7,656,176 →

Application: 11/718,065 →

Publication: US 2009/0140756

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.