Assignment of Assignor's Interest

Recorded: 2009-12-28 Pages: 2

Assignors

VISHNIA, ITAI

Executed: 2009-12-21

BLEIER, ZVI

Executed: 2009-12-21

Assignee

PLX

25 WEST JEFRYN BLVD., DEER PARK, NEW YORK, 11729

Covered Property (1)

Alignment Free Interferometr and Alignment Free Method of Profiling Object Surfaces

Patent: 6,473,185 →

Application: 09/800,994 →

Publication: US 2002/0126294

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.