Patent Assignment
Reel/Frame 023837/0072
Assignment of Assignor's Interest
Recorded: 2010-01-25
Pages: 2
Assignor
SEKINO, KENTAROU
Executed: 2010-01-04
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Electrical Testing Device and Electrical Testing Method with Control of Probe Contact Pressure
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.