Patent Assignment
Reel/Frame 023844/0038
Assignment of Assignor's Interest
Recorded: 2010-01-22
Pages: 3
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Self Displacement Sensing Cantilever and Scanning Probe Microscope
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.