Patent Assignment
Reel/Frame 023924/0229
Assignment of Assignor's Interest
Recorded: 2010-02-11
Pages: 5
Assignors
KUO, SUNG-NIEN
Executed: 2010-02-09
HSIEH, YUAN-YU
Executed: 2010-02-09
KO, WEN-HSIUNG
Executed: 2010-02-09
LEE, JIH-SAN
Executed: 2010-02-09
JUAN, KUEI-CHI
Executed: 2010-02-09
SU, KUAN-CHENG
Executed: 2010-02-09
Assignee
UNITED MICROELECTRONICS CORP.
NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, TAIWAN
Covered Property
(1)
Alternating Current (Ac) Stress Test Circuit, Method for Evaluating Ac Stress Induced Hot Carrier Injection (Hci) Degradation, and Test Structure for Hci Degradation Evaluation