Patent Assignment
Reel/Frame 023969/0968
Assignment of Assignor's Interest
Recorded: 2010-02-22
Pages: 2
Assignors
NAKAGAWA, HIROMITSU
Executed: 2010-02-05
MORI, YASUHIDE
Executed: 2010-02-05
NAKAMURA, TOMOHIRO
Executed: 2010-02-05
KIKUCHI, KATSURO
Executed: 2010-02-05
Assignee
HITACHI, LTD.
6-6, MARUNOUCHI 1-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property
(1)
Abnormality Detection Method, Device and Program