Patent Assignment
Reel/Frame 024022/0480
Assignment of Assignor's Interest
Recorded: 2010-03-03
Pages: 2
Assignors
GOTO, TERUTAKA
Executed: 2010-01-08
KANETA, HIROSHI
Executed: 2010-01-08
NEMOTO, YUICHI
Executed: 2010-01-08
Assignee
NIIGATA UNIVERSITY
8050, IKARASHI NI-NOCHO, NISHI-KU, NIIGATA, 9502181, JAPAN
Covered Property
(1)
Quantitative Evaluation Device of Atomic Vacancies Existing in Silicon Wafer, Method for the Device, Silicon Wafer Manufacturing Method, and Thin-Film Oscillator