Patent Assignment
Reel/Frame 024031/0212
Assignment of Assignor's Interest
Recorded: 2010-03-04
Pages: 3
Assignors
LEE, SEUNG SEOUP
Executed: 2009-12-23
KIM, TAK GYUM
Executed: 2009-12-02
PARK, JIN WON
Executed: 2009-12-23
Assignee
SAMSUNG ELECTRO-MECHANICS CO., LTD.
314, MAETAN 3-DONG, YEONGTONG-GU, SUWON, GYUNGGI-DO, 443-743, KOREA, REPUBLIC OF
Covered Property
(1)
Method of Inspecting Defects in Circuit Pattern of Substrate