Patent Assignment
Reel/Frame 024043/0424
Assignment of Assignor's Interest
Recorded: 2010-03-08
Pages: 8
Assignors
HAN, JONG-WON
Executed: 2010-02-05
LEE, SANGSIK
Executed: 2010-02-11
GOH, SEOK
Executed: 2010-02-05
MIN, BYOUNGJUN
Executed: 2010-02-05
PARK, JONGPIL
Executed: 2010-02-05
OH, JAEMUK
Executed: 2010-02-05
KIM, JUNGHYEON
Executed: 2010-02-03
Assignee
SAMSUNG ELECTRONICS CO., LTD
416 MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Test Socket, and Test Apparatus with Test Socket to Control a Temperature of an Object to Be Tested