Patent Assignment
Reel/Frame 024147/0443
Assignment of Assignor's Interest
Recorded: 2010-03-26
Pages: 3
Assignor
KOBATAKE, HIROYUKI
Executed: 2010-03-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Test Circuit and Test Method for Testing Differential Input Circuit
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.