IP Library Assignment 024181/0267
Patent Assignment
Reel/Frame 024181/0267

Assignment of Assignor's Interest

Recorded: 2010-04-02 Pages: 3
Assignors
DORSEL, ANDREAS
Executed: 2010-01-22
SCHMIDT, STEFAN
Executed: 2010-01-22
Assignee
CARL ZEISS SMT AG
RUDOLF-EBER-STRASSE 2, OBERKOCHEN, 73447, GERMANY
Covered Property (1)
Method for Examining a Wafer with Regard to a Contamination Limit and Euv Projection Exposure System
Patent: 7,955,767 →
Application: 12/690,571 →
Publication: US 2010/0183962
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
A Modifying Conversion Jan 18, 2011
From: CARL ZEISS SMT AG
To: CARL ZEISS SMT GMBH
Reel/Frame 025763/0367 →