Patent Assignment
Reel/Frame 024190/0023
Assignment of Assignor's Interest
Recorded: 2010-04-05
Pages: 2
Assignor
KOBAYASHI, NORIFUMI
Executed: 2010-02-23
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Semiconductor Test Apparatus and Test Method for Semiconductor Device
Application:
12/717,582 →
Publication:
US 2010/0237893