IP Library › Assignment 024445/0683
Patent Assignment
Reel/Frame 024445/0683

Change of Name

Recorded: 2010-05-27 Pages: 13
Assignor
FUJITSU MICROELECTRONICS LIMITED
Executed: 2010-04-01
Assignee
FUJITSU SEMICONDUCTOR LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU,, YOKOHAMA-SHI, KANAGAWA, 222-0033, JAPAN
Covered Property (1)
Reticle, Reticle Inspection Method and Reticle Inspection Apparatus
Patent: 7,511,817 →
Application: 10/709,244 →
Publication: US 2005/0110997
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Apr 23, 2004
From: HORIE, TSUTOMU
To: FUJITSU LIMITED
Reel/Frame 014527/0043 →
Assignment of Assignor's Interest Dec 5, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021976/0876 →