IP Library › Assignment 024463/0426
Patent Assignment
Reel/Frame 024463/0426

Change of Name

Recorded: 2010-06-01 Pages: 17
Assignor
FUJITSU MICROELECTRONICS LIMITED
Executed: 2010-04-01
Assignee
FUJITSU SEMICONDUCTOR LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU YOKOHAMA-SHI, JAPAN
Covered Properties (2)
Temperature Sensor Circuit and Calibration Method Thereof
Patent: 7,399,116 →
Application: 11/028,649 →
Publication: US 2005/0271115
Temperature Sensor Circuit and Calibration Method Thereof
Patent: 7,891,869 →
Application: 12/144,167 →
Publication: US 2008/0259990
Related Assignments (6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 5, 2005
From: TAKEUCHI, ATSUSHI
To: FUJITSU LIMITED
Reel/Frame 016149/0352 →
Assignment of Assignor's Interest Dec 11, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021977/0219 →
Assignment of Assignor's Interest Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
Change of Name Mar 18, 2010
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 024100/0105 →
Assignment of Assignor's Interest Jun 1, 2010
From: TAKEUCHI, ATSUSHI
To: FUJITSU LIMITED
Reel/Frame 024462/0830 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0469 →