Patent Assignment
Reel/Frame 024545/0501
Assignment of Assignor's Interest
Recorded: 2010-06-16
Pages: 3
Assignors
WASHIO, KENICHI
Executed: 2010-06-09
YASUTA, KATSUO
Executed: 2010-06-11
SUGIYAMA, UMENORI
Executed: 2010-06-12
MASUTA, HIKARU
Executed: 2010-06-11
Assignee
KABUSHIKI KAISHA NIHON MICRONICS
6-8, KICHIJOJIHONCHO 2-CHOME, MUSASHINO-SHI, TOKYO, JAPAN
Covered Property
(1)
Wafer Prober for Semiconductor Inspection and Inspection Method