Patent Assignment
Reel/Frame 024714/0030
Assignment of Assignor's Interest
Recorded: 2010-07-21
Pages: 4
Assignors
HUANG, PONG-WEY
Executed: 2010-05-15
LIU, HSI-HUA
Executed: 2010-05-15
WANG, CHIA-JEN
Executed: 2010-05-15
LEI, SHUEN-CHENG
Executed: 2010-05-15
HUANG, HUAI-TE
Executed: 2010-05-15
HUANG, JEN-PO
Executed: 2010-05-15
Assignee
UNITED MICROELECTRONICS CORP.
NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, R.O.C., TAIWAN
Covered Property
(1)
Method and Pattern Carrier for Optimizing Inspection Recipe of Defect Inspection Tool