IP Library Assignment 024916/0106
Patent Assignment
Reel/Frame 024916/0106

Assignment of Assignor's Interest

Recorded: 2010-08-31 Pages: 3
Assignors
SHI, RUIFANG
Executed: 2010-08-30
XIONG, YALIN
Executed: 2010-08-30
Assignee
KLA-TENCOR CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property (1)
Wafer Plane Detection of Lithographically Significant Contamination Photomask Defects
Patent: 8,611,637 →
Application: 12/871,813 →
Publication: US 2011/0299758