Assignment of Assignor's Interest

Recorded: 2010-09-22 Pages: 3

Assignor

FUKAMI, IKUO

Executed: 2010-08-25

Assignee

RENESAS ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN

Covered Property (1)

Semiconductor Apparatus and Method of Detecting Characteristic Degradation of Semiconductor Apparatus

Patent: 8,717,058 →

Application: 12/886,115 →

Publication: US 2011/0068818

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.