Patent Assignment
Reel/Frame 025045/0659
Assignment of Assignor's Interest
Recorded: 2010-09-27
Pages: 3
Assignor
XIAO, HONG
Executed: 2010-09-17
Assignee
HERMES MICROVISION, INC.
4F, NO. 18, CREATION ROAD 1, HSINCHU SCIENCE PARK, HSINCHU, 300, TAIWAN
Covered Property
(1)
Test Structure for Charged Particle Beam Inspection and Method for Defect Determination Using the Same
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.