IP Library Assignment 025329/0236
Patent Assignment
Reel/Frame 025329/0236

Assignment of Assignor's Interest

Recorded: 2010-11-08 Pages: 2
Assignors
JUNG, WOO YUNG
Executed: 2007-12-17
SIM, GUEE HWANG
Executed: 2007-12-17
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, KYOUNGKI-DO, ICHEON-SI, KOREA, REPUBLIC OF
Covered Property (1)
Method of Forming an Etching Mask Pattern from Developed Negative and Positive Photoresist Layers
Patent: 7,851,135 →
Application: 11/948,631 →
Publication: US 2009/0142711