Patent Assignment
Reel/Frame 025436/0135
Assignment of Assignor's Interest
Recorded: 2010-12-02
Pages: 8
Assignors
WALL, JOHN
Executed: 2010-11-25
JACQUES, DAVID
Executed: 2010-11-25
YOKHIN, BORIS
Executed: 2010-11-25
KROKHMAL, ALEXANDER
Executed: 2010-11-30
RYAN, PAUL
Executed: 2010-11-25
BYTHEWAY, RICHARD
Executed: 2010-11-25
BERMAN, DAVID
Executed: 2010-11-30
WORMINGTON, MATTHEW
Executed: 2010-11-29
Assignee
JORDAN VALLEY SEMICONDUCTORS LTD.
P.O. BOX 103, MIGDAL HAEMEK, 23100, ISRAEL
Covered Property
(1)
Fast Measurement of X-Ray Diffraction from Tilted Layers
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.