Patent Assignment
Reel/Frame 055994/0565
Change of Name
Recorded: 2021-04-13
Pages: 9
Assignor
JORDAN VALLEY SEMICONDUCTORS LTD.
Executed: 2019-07-18
Assignee
BRUKER TECHNOLOGIES LTD.
6 HAMECHKAR STREET, P.O. BOX 103, MIGDAL HAEMEK, 2306990, ISRAEL
Covered Properties
(39)
X-Ray Fluorescence Apparatus
Patent:
6,711,234 →
Application:
10/130,586 →
Soller Slit Using Low Density Materials
Vacuum Ultraviolet Reflectometer System and Method
Vacuum Ultraviolet Referencing Reflectometer
Semiconductor Processing Techniques Utilizing Vacuum Ultraviolet Reflectometer
Broad Band Referencing Reflectometer
Method and Apparatus for Performing Highly Accurate Thin Film Measurements
Method and Apparatus for Accurate Calibration of Vuv Reflectometer
Vacuum Ultraviolet Reflectometer Having Collimated Beam
Vacuum Ultraviolet Reflectometer Integrated with Processing System
Method and Apparatus for Accurate Calibration of a Reflectometer by Using a Relative Reflectance Measurement
Method and Apparatus for Accurate Calibration of a Reflectometer by Using a Relative Reflectance Measurement
Curved X-Ray Reflector
Vacuum ultra-violet reflectometer with stray light correction
Multi-Detector Edxrd
Contamination Monitoring and Control Techniques for Use with an Optical Metrology Instrument
Patent:
7,342,235 →
Application:
11/600,413 →
Contamination Monitoring and Control Techniques for Use with an Optical Metrology Instrument
Contamination Monitoring and Control Techniques for Use with an Optical Metrology Instrument
Prism Spectrometer
Spectrometer with Collimated Input Light
Spectrometer with Moveable Detector Element
Method and Apparatus for Accurate Calibration of a Reflectometer by Using a Relative Reflectance Measurement
Broad Band Referencing Reflectometer
Automated Calibration Methodology for Vuv Metrology System
Broad Band Referencing Reflectometer
Method and Apparatus for Using Multiple Relative Reflectance Measurements to Determine Properties of a Sample Using Vacuum Ultra Violet Wavelengths
Method and Apparatus for Optically Measuring Periodic Structures Using Orthogonal Azimuthal Sample Orientation
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity
Method and System for Using Reflectometry Below Deep Ultra-Violet (Duv) Wavelengths for Measuring Properties of Diffracting or Scattering Structures on Substrate Work Pieces
Method and Apparatus for Accurate Calibration of Vuv Reflectometer
Broad Band Referencing Reflectometer
Fast Measurement of X-Ray Diffraction from Tilted Layers
Enhancing Accuracy of Fast High-Resolution X-Ray Diffractometry
Optical Vacuum Ultra-Violet Wavelength Nanoimprint Metrology
Combining X-Ray and Vuv Analysis of Thin Film Layers
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity
Detection of Wafer-Edge Defects
X-Ray Beam Conditioning
X-Ray Detector Assembly with Shield
Related Assignments
(22)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
May 16, 2002
From: LOXLEY, NEIL; BOWEN, DAVID KEITH; PINA, LADISLAV
To: BEDE SCIENTIFIC INSTRUMENTS LIMITED
Reel/Frame 013164/0810 →
Assignment of Assignor's Interest
Dec 29, 2003
From: HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 014846/0761 →
Assignment of Assignor's Interest
Dec 30, 2003
From: HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 014847/0263 →
Assignment of Assignor's Interest
Dec 30, 2003
From: HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 014854/0202 →
Assignment of Assignor's Interest
Jan 28, 2004
From: BOWEN, DAVID KEITH; PINA, LADISLAV; INNEMAN, ADOLF; MENZER, STEPHAN
To: BEDE SCIENTIFIC INSTRUMENTS LTD.
Reel/Frame 014928/0448 →
Assignment of Assignor's Interest
Jul 30, 2004
From: HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 015700/0707 →
Assignment of Assignor's Interest
Aug 31, 2004
From: HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 015757/0675 →
Assignment of Assignor's Interest
Aug 31, 2004
From: HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 015758/0845 →
Assignment of Assignor's Interest
Jun 26, 2006
From: WALSH, PHILLIP; HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 018013/0562 →
Assignment of Assignor's Interest
Jul 25, 2006
From: SHERMAN, DOV
To: JORDAN VALLEY SEMICONDUCTORS LTD.
Reel/Frame 018091/0087 →
Assignment of Assignor's Interest
Aug 2, 2006
From: WALSH, PHILLIP; HARRISON, DALE A.
To: METROSOL, INC.
Reel/Frame 018105/0068 →
Assignment of Assignor's Interest
Nov 16, 2006
From: HARRISON, DALE A.; WELDON, MATTHEW
To: METROSOL, INC.
Reel/Frame 018593/0458 →
Assignment of Assignor's Interest
Nov 16, 2006
From: HARRISON, DALE A.; WELDON, MATTHEW
To: METROSOL, INC.
Reel/Frame 018582/0590 →
Assignment of Assignor's Interest
Nov 16, 2006
From: HARRISON, DALE A.; WELDON, MATTHEW
To: METROSOL, INC.
Reel/Frame 018613/0373 →
Assignment of Assignor's Interest
Nov 20, 2006
From: YOKHIN, BORIS; KROKHMAL, ALEXANDER; TOKAR, ALEX
To: JORDAN VALLEY SEMICONDUCTORS LTD.
Reel/Frame 018615/0833 →
Assignment of Assignor's Interest
Sep 28, 2008
From: BEDE SCIENTIFIC INSTRUMENTS LIMITED
To: JORDAN VALLEY SEMICONDUCTORS LIMITED
Reel/Frame 021590/0376 →
Security Agreement
Nov 13, 2009
From: METROSOL, INC.
To: SILICON VALLEY BANK
Reel/Frame 023510/0495 →
Release and Reassignment of Patents and Patent Applications
Mar 19, 2010
From: SILICON VALLEY BANK
To: METROSOL, INC.
Reel/Frame 024103/0794 →
Assignment of Assignor's Interest
Mar 21, 2010
From: METROSOL INC.
To: JORDAN VALLEY SEMICONDUCTORS LTD.
Reel/Frame 024103/0802 →
Assignment of Assignor's Interest
Mar 24, 2010
From: HARRISON, DALE A
To: METROSOL, INC
Reel/Frame 024120/0876 →
Assignment of Assignor's Interest
Mar 28, 2010
From: HARRISON, DALE A
To: METROSOL, INC
Reel/Frame 024140/0938 →
Security Interest
Apr 26, 2018
From: VUV ANALYTICS, INC.
To: SILICON VALLEY BANK
Reel/Frame 045648/0825 →