Patent Assignment
Reel/Frame 025545/0082
Assignment of Assignor's Interest
Recorded: 2010-12-28
Pages: 2
Assignor
LI, JIE
Executed: 2010-12-28
Assignee
NANOMETRICS INCORPORATED
1550 BUCKEYE DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Property
(1)
Simultaneous Measurement Of Multiple Overlay Errors Using Diffraction Based Overlay
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.