Patent Assignment
Reel/Frame 025551/0186
Assignment of Assignor's Interest
Recorded: 2010-12-28
Pages: 2
Assignor
HAMAGUCHI, SHINICHI
Executed: 2010-12-01
Assignee
ADVANTEST CORPORATION
1-32-1, ASAHI-CHO, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property
(1)
Wafer Unit Manufacturing Method for Testing a Semiconductor Chip Wafer
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.