IP Library › Assignment 025616/0705
Patent Assignment
Reel/Frame 025616/0705

Assignment of Assignor's Interest

Recorded: 2010-12-22 Pages: 5
Assignors
IDE, AKIRA
Executed: 2010-10-28
YOKO, HIDEYUKI
Executed: 2010-10-28
SHIBATA, KAYOKO
Executed: 2010-10-28
TANAMACHI, KENICHI
Executed: 2010-10-28
EGUCHI, TAKANORI
Executed: 2010-10-28
SHIGEZANE, YASUYUKI
Executed: 2010-10-28
OGAWA, NAOKI
Executed: 2010-10-28
HIDAKA, KAZUO
Executed: 2010-10-28
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Device, Semiconductor Device Testing Method, and Data Processing System
Patent: 8,498,831 →
Application: 12/923,831 →
Publication: US 2011/0093224
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Assignment of Assignor's Interest May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032897/0001 →
Change of Name Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →