IP Library › Assignment 025701/0669
Patent Assignment
Reel/Frame 025701/0669

Assignment of Assignor's Interest

Recorded: 2011-01-26 Pages: 3
Assignors
HIROI, TAKASHI
Executed: 2010-11-25
YOSHIDA, TAKEYUKI
Executed: 2010-11-25
HOSOYA, NAOKI
Executed: 2010-11-30
HONDA, TOSHIFUMI
Executed: 2010-11-29
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU,, TOKYO, JAPAN
Covered Property (1)
Circuit Pattern Examining Apparatus and Circuit Pattern Examining Method
Patent: 8,509,516 →
Application: 13/056,046 →
Publication: US 2011/0129141
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →