Assignment of Assignor's Interest

Recorded: 2011-01-31 Pages: 3

Assignors

TSUCHIYA, HIDEO

Executed: 2011-01-26

ABE, TAKAYUKI

Executed: 2011-01-26

Assignee

NUFLARE TECHNOLOGY, INC.

2068-3, OOKA, NUMAZU-SHI, SHIZUOKA, 410-8510, JAPAN

Covered Property (1)

Defect Estimation Device and Method and Inspection System and Method

Patent: 8,737,676 →

Application: 13/017,641 →

Publication: US 2011/0188734