IP Library › Assignment 025776/0102
Patent Assignment
Reel/Frame 025776/0102

Assignment of Assignor's Interest

Recorded: 2011-02-09 Pages: 3
Assignors
TAKAHASHI, NORITSUGU
Executed: 2011-01-17
FUKUDA, MUNEYUKI
Executed: 2011-01-17
SHOJO, TOMOYASU
Executed: 2011-01-17
SUZUKI, NAOMASA
Executed: 2011-01-18
OBARA, KENJI
Executed: 2011-01-24
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Defect Review System and Method, and Program
Patent: 8,467,595 →
Application: 13/056,353 →
Publication: US 2011/0129142
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →